Copyright © 2011 Fischer-Cripps Laboratories Pty Ltd. .
PO Box 9 Forestville, Sydney NSW Australia 2087
mail@ibisonline.com.au
Standards-quality nanoindentation instruments
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Diamond indenters Berkovich, Vickers, Knoop, Sphero-cones, supplied with Area function calibration. Special purpose probes also available. AFM systems. DS95-200: 200 x 200 um scan size; <0.3 nm X,Y,Z resolution; 15 um z range; >1.5 mm approach. Download Information Sheet Standard specimens Optical grade fused silica and sapphire disks optionally mounted on hardened and ground steel specimen mounts. Lateral Force (Scratch) Tester Lateral force sensor enables measurement of friction coefficient with IBIS. Download Information Sheet |
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Finite Element Analysis Programmed interface to a commercially available FEA program means that you can perform numerical simulations by simply filling in data entry boxes - nominate your indenter shape and size, film thickness, E, Y and v, and press the button - the software automatically builds the mesh, arranges contact elements, and performs a non-linear elastic-plastic analysis. Full stress field, and a load displacement curves are provided as outputs. Download Information Sheet |
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Acoustic Emission Sensor Specialised ultrasonic microphone embedded in a specimen mount for monitoring of acoustic emission phenomena during an indentation test. Download information sheet |
