Telephone:
+61 2 9972 4247
Email: mail@ibisonline.com.au
24/32-34 Campbell Ave, Cromer, NSW 2099 Australia
A range of useful accessories is available for UMIS and IBIS at very competitive pricing.
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Diamond indenters Berkovich, Vickers, Knoop, Sphero-cones, Wedge Supplied with Area function calibration. |
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Special purpose probes A variety of special purpose probes can be supplied for unusual applications - from flat platens to spherical balls, wedges, cylinders, etc. |
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DME brand AFM systems. DS45-40: 40 x 40 um scan size; <1 nm X,Y,Z resolution; 2.7 um z range; >1.5 mm approach. Download Information Sheet DS95-200: 200 x 200 um scan size; <0.3 nm X,Y,Z resolution; 15 um z range; >1.5 mm approach. Download Information Sheet |
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Standard specimens Optical grade fused silica and sapphire disks optionally mounted on hardened and ground steel specimen mounts. |
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Lateral Force (Scratch) Tester Lateral force sensor enables measurement of friction coefficient with IBIS. Download Information Sheet |
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Finite Element Analysis Programmed interface to a commercially available FEA program means that you can perform numerical simulations by simply filling in data entry boxes - nominate your indenter shape and size, film thickness, E, Y and v, and press the button - the software automatically builds the mesh, arranges contact elements, and performs a non-linear elastic-plastic analysis. Full stress field, and a load displacement curves are provided as outputs. Download Information Sheet |
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Acoustic
Emission Sensor Specialised ultrasonic microphone embedded in a specimen mount for monitoring of acoustic emission phenomena during an indentation test. Download information sheet |
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Hot Stage CE certified to 500 C this unique accessory enables you to do high temperature nanoindentation testing. |
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