Accessories

A range of useful accessories is available for UMIS and IBIS at very competitive pricing.

Diamond indenters Berkovich, Vickers, Knoop, Sphero-cones, Wedge Supplied with Area function calibration.
Special purpose probes A variety of special purpose probes can be supplied for unusual applications - from flat platens to spherical balls, wedges, cylinders, etc.
DME brand AFM systems. DS45-40: 40 x 40 um scan size; <1 nm X,Y,Z resolution; 2.7 um z range; >1.5 mm approach. Download Information Sheet DS95-200: 200 x 200 um scan size; <0.3 nm X,Y,Z resolution; 15 um z range; >1.5 mm approach. Download Information Sheet
Standard specimens Optical grade fused silica and sapphire disks optionally mounted on hardened and ground steel specimen mounts.
Lateral Force (Scratch) Tester Lateral force sensor enables measurement of friction coefficient with IBIS. Download Information Sheet
Finite Element Analysis Programmed interface to a commercially available FEA program means that you can perform numerical simulations by simply filling in data entry boxes - nominate your indenter shape and size, film thickness, E, Y and v, and press the button - the software automatically builds the mesh, arranges contact elements, and performs a non-linear elastic-plastic analysis. Full stress field, and a load displacement curves are provided as outputs. Download Information Sheet
Acoustic Emission Sensor Specialised ultrasonic microphone embedded in a specimen mount for monitoring of acoustic emission phenomena during an indentation test. Download information sheet
Hot Stage CE certified to 500 C this unique accessory enables you to do high temperature nanoindentation testing.

Accessories

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