|
Diamond indenters Berkovich, Vickers, Knoop, Sphero-cones, Wedge Supplied with Area function calibration. |
![]() |
|
Special purpose probes A variety of special purpose probes can be supplied for unusual applications - from flat platens to spherical balls, wedges, cylinders, etc. |
![]() |
|
DME Brand AFM systems. DS45-40: 40 x 40 um scan size; <1 nm X,Y,Z resolution; 2.7 um z range; >1.5 mm approach. Download Information Sheet DS95-200: 200 x 200 um scan size; <0.3 nm X,Y,Z resolution; 15 um z range; >1.5 mm approach. Download Information Sheet |
![]() |
Standard specimens
|
|
|
Lateral Force (Scratch) Tester Lateral force sensor enables measurement of friction coefficient with IBIS. Download Information Sheet |
![]() |
Finite Element Analysis
|
![]() |
|
Acoustic
Emission Sensor Specialised ultrasonic microphone embedded in a specimen mount for monitoring of acoustic emission phenomena during an indentation test. |
![]() |
|
Hot Stage CE certified to 500 C this unique accessory enables you to do high temperature nanoindentation testing (UMIS only, IBIS under development). Download Information Sheet |
![]() |







