Telephone: +61 2 9972 4247
Email: mail@ibisonline.com.au
24/32-34 Campbell Ave, Cromer, NSW 2099 Australia

IBIS Nanoindentation System

Our core capability is nanoindentation. To this end, we have developed the IBIS nanoindentation system with the aim of providing precision, robustness and value with industry-leading specifications. IBIS is a new product resulting from 20 years development within CSIRO, Australia's premier research organisation. Such is our confidence in the instruments that they come with 3 YEAR warranty. IBIS instruments are sold worldwide.

IBIS is a precision nanoindentation tester offering traceable calibration, robust design, closed loop operation, solid theoretical base, and unmatched accuracy, reliability and price. The instrument is compatible with ISO14577. A range of models is available to suit budget constraints. The IBIS nanoindentation tester is a result of 20 years development at the CSIRO National Standards Laboratory in Sydney, Australia. 

To make an enquiry or obtain a written and prompt quotation: email us or see our list of local representatives in your area.

IBIS Nanoindenter
click for larger image

There are three models available. All models come with motorized z axis for automatic approach. The most popular "Authority" has high resolution closed loop XY stages and 4-turret microscope. "Simplus" and "Advantage" models have less expensive open loop stepper motor drives. All models can be fitted a choice of load ranges to suit your application.

These are full systems, with high precision calibration, built to an exact standard and designed for years of reliable service.



Product brochure

We can offer this level of instrumentation at this price because our development costs have been fully recovered in the 20 year history of the product. The value proposition offered by the IBIS system is unmatched.

Base system:
(includes many features normally supplied as extras in competitor systems).

  • CSIRO patented dual leaf spring LVDT sensor system featuring closed loop feedback, high precision PZT actuator, and robust construction.

  • Quasi-static nanoindentation with depth partial unload depth profiling. Oliver and Pharr, and Field and Swain analyses methods.

  • Hardness vs depth measurements

  • Automatic indentation profile generation or user-created array

  • Capable of user-defined loading and unloading sequences

  • Mathematical functions for smoothing and fitting of data

  • Constant load creep testing, 2, 3 and 4 element modelling.

  • Scratch testing (lateral force sensor optional)

  • Tension and compression testing

  • Dynamic oscillatory motion and multiple frequency Fourier transform analysis.

  • Motorized Z axis for automatic approach

  • Sample mounts, ground flat and polished for parallelism

  • Convenient magnetic sample mounting

  • Fused silica standard specimen

  • Lined enclosure for acoustic and thermal insulation

  • Electronics control unit

  • Computer with LCD monitor

  • IBIS Nanoindentation Software (includes control, analysis, diagnostics, and contact mechanics functions)

  • Berkovich diamond indenter (calibrated)

  • Traceable calibration

  • 3 year full warranty

  • Air spring mounting (optional optical workstation)

  • Economical open loop stepper motor stages, X only or X and Y (upgrade to closed loop dc motor stages available).

  • Various microscope options available including point and click indenter positioning.

Unlike competitor products, the dual load and displacement ranges makes this instrument suitable for measurements on both soft and hard materials with high precision.

Essential features:

  • Dedicated force sensor separate from load actuator
    (a CSIRO world first for nanoindentation)

  • Dual range force and displacement sensors

  • Real time force (and displacement) feedback

  • Precision PZT actuator

  • Closed loop XY positioning ("Advantage" model)

  • Robust LVDT design can withstand significant abuse
    (a CSIRO world first)

  • Unattended operation

  • Automatic z approach

  • Compact design, clear span for large samples

  • Easy indenter changeover
    (no messy clamps, special tools or service calls)

  • 3 year warranty

Options

  • High load (up to 5N) system available

  • 4-turret microscope

  • High precision stages

  • Finite element analysis module

  • Acoustic emission sensor

  • Lateral force measurement (nano/micro-scratch)

  • Hot stage (early 2010)

  • Anti-vibration table

  • Special purpose probes

  • AFM objective